• Adeel A. Bhutta's Research

  • Research Publications
    [REFEREED JOURNALS]
    Selective Subtraction for Handheld Cameras  

           Adeel A. Bhutta, Imran N. Junejo, Hassan Foroosh

           Accepted for publication in IEEE Access, 2020, 10.1109/ACCESS.2020.2973655

    Single Class Support Vector Machine (SVM) for Scene Modeling   pdf

           Imran N. Junejo, Adeel A. Bhutta, Hassan Foroosh

           Journal of Signal, Image and Video Processing, Springer-Verlag, May 28, 2011, DOI: 10.1007/s11760-011-0230-z

    [REFEREED CONFERENCES]
    Maintaining and Promoting Student Agency in the Era of Digital Textbooks  

           Dan-Adrian German and Adeel A. Bhutta

           European Conference on e-Learning (ECEL) 2019

    Maintaining and Promoting Student Agency in the Era of Digital Textbooks  

           Dan-Adrian German and Adeel A. Bhutta

           The International Society for the Scholarship of Teaching and Learning (ISSOTL) 2019

    A Survey on Machine Learning based Detection on DDoS Attacks for IoT Systems  

           Khadijeh Wehbi, Liang Hong, Tulha Al-salah and Adeel A. Bhutta

           IEEE SouthEastCon 2019

    Selective Subtraction when The Scene Cannot be Learned (Oral Paper) pdf 

           Adeel A. Bhutta, Imran N. Junejo, Hassan Foroosh

           IEEE International Conference on Image Processing (ICIP), 2011,  pp. 3330-3333, ISBN: 978-1-4577-1303-3

    Dynamic Scene Modeling for Object Detection Using Single-Class SVM pdf

        Imran N. Junejo,   Adeel A. Bhutta , Hassan Foroosh

           IEEE International Conference on Image Processing (ICIP), 2010, pp. 1541-1544, ISBN: 978-1-4244-7993-1.

    Blind Blur Estimation using Low Rank Estimation of Cepstrum pdf  sourcecode

           Adeel A. Bhutta, Hassan Foroosh

            International Conference on Image Analysis and Recognition (ICIAR), 2006, LNCS, Vol. 4141, pp. 94-103, DOI: 10.1007/11867586_9. 

    On Combining Encryption for Multiple Data Streams pdf

           Adeel A. Bhutta, Hassan Foroosh

           IEEE International Multi topic Conference  (INMIC), 2005, pp. 1-6, DOI: 10.1109/INMIC.2005.334430.